New software update enhances Raman and correlative microscopy

Oxford Instruments has announced a major update to its operating software for Raman and correlative microscopes. The latest version, WITec Suite SEVEN, introduces DataTrace, an Enhanced Project Manager, Spectral Certification, and Advanced Cosmic Ray Removal, expanding the platform’s capabilities for measurement control and data analysis.

DataTrace provides comprehensive tracking of measurement settings and data processing steps, including algorithm parameters, data derivation records, and user activity with timestamps. A meta info viewer offers a complete history of experiments, enabling easy searches and parameter exports. These features enhance experiment repeatability and data reproducibility.

The Enhanced Project Manager introduces a redesigned data object window with a new toolbar for quick search, a color-coded hierarchical display, and options to selectively hide objects. This streamlined interface simplifies complex investigations and improves workflow efficiency.

Spectral Certification ensures system calibration accuracy by comparing spectra against standardised reference samples. Certified spectra are clearly labelled within the software, facilitating work in multi-user facilities and regulatory environments.

Advanced Cosmic Ray Removal eliminates artifacts caused by high-energy particles hitting the detector. It effectively removes multiple cosmic rays, wide artifacts, and those interfering with Raman peaks, making it ideal for long acquisition times and high-precision measurements.

With these enhancements, WITec Suite SEVEN delivers a more transparent, intuitive, and precise software environment. Researchers can now achieve optimal performance from their microscopes and gain deeper insights from their data.

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