Advanced SIMS detector strengthens analysis of flexible solar cell materials

Hiden Analytical has introduced the Dual Polarity Simultaneous Detector for its SIMS Workstation platform, enabling more efficient and information-rich analysis of advanced materials used in flexible solar cells and other thin-film technologies.

Secondary Ion Mass Spectrometry (SIMS) is widely valued for its ability to deliver extremely high sensitivity and precise depth profiling, making it a core technique in semiconductor fabrication, thin-film coating, and materials research. By sputtering the sample surface with a controlled ion beam, SIMS reveals elemental and isotopic composition with resolution approaching individual atomic layers.

A longstanding limitation of SIMS analysis is the need to perform separate measurements for positively and negatively charged secondary ions. This not only increases analysis time but can also complicate the interpretation of complex, multi-layered samples.

Hiden Analytical’s Dual Polarity Simultaneous Detector addresses this challenge by capturing both ion polarities during a single analytical run. The result is faster data acquisition alongside improved alignment between datasets, delivering a more complete chemical picture without the need for repeat measurements.

This capability is particularly valuable when analysing sophisticated photovoltaic structures such as CIGS-based flexible solar cells, where performance depends on subtle compositional changes across thin layers. In failure analysis scenarios, the ability to interrogate a single defect using both ion polarities in one measurement provides deeper insight into material behaviour and degradation mechanisms.

According to Dr Graham Cooke, Principal Scientist at Hiden Analytical, the new detector enhances the practical efficiency of SIMS while expanding its analytical reach, reinforcing its role as a powerful yet cost-effective tool for thin-film characterisation.

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