CLEM Solution Centre Launch

A collaborative project between Nikon and Jeol has resulted in the opening of a dedicated centre for Correlative Light & Electron Microscopy (CLEM), which will provide experience in and collect and deliver technical information on cutting-edge CLEM solutions. Announced by Jeol’s President Gon-emon Kurihara on 1st September, the centre is located in Jeol’s R&D building, Tokyo.

CLEM is an effective observation and analysis method that combines the advantages of two microscope types: optical microscopes, which allow fast wide field observation and acquisition of the positional and localisation information of molecules and electron microscopes, which allow acquisition of minute structure data by observation of samples under high spatial resolution. In recent years, the need for more effectively using CLEM, by linking optical and electron microscopes via software, has increased in cutting-edge bioscience and material development research.

In 2013, Jeol developed the ‘miXcroscopy™ Linked Optical & Scanning Electron Microscopy System’ in collaboration with Nikon. Furthermore, in February 2014, Jeol signed a capital and business alliance agreement with Nikon, and has promoted cooperation between the two companies to build CLEM solution that combine Nikon’s optical microscopes and Jeol’s electron microscopes, as well as enhancing product development and sales capabilities.

At the new Solution Center, Jeol will introduce 'miXcroscopy™', and offer CLEM solutions to promote the use of CLEM. Jeol will also collect and deliver information that will improve CLEM technology through dialogue with customers, and contribute to generating new benefits in bioscience and material development research.

Please contact the Center to arrange a demonstration. Demonstrations are by appointment only.