Carl Zeiss Launches Photo Competition for Electron Microscopy

Carl Zeiss has launched a nano-imaging competition for the first time and is inviting all users of CZ electron and ion microscopes worldwide to submit entries up until August 29th 2010 on the company’s Nano Technology
Systems website.

The website with the collection of the Nano-masterpieces is open to anyone who wants to view and vote on the submitted images. The four selected winners will receive a cinemizer Plus 3D video viewer.

“Fascinating electron microscope images are sitting around in numerous archives without an opportunity for recognition. With this competition, we want to give users of our systems an innovative platform to present their
images and the underlying work to the public,” explained Dr Peter Fruhstorfer, Member of the Management Board of the Nano Technology Systems Division at Carl Zeiss.

‘A picture’ says more than a thousand words - and images taken with electron and ion microscopes frequently provide unique insights into the specimens and lead to new scientific-technical knowledge. At the same time,
these images often feature outstanding aesthetic properties. “We are already anxiously awaiting your images,” adds Fruhstorfer.

Any images not more than two years old that were taken using particle beam systems from Carl Zeiss are eligible. Images can be entered in any of four categories: SEM, TEM, CrossBeam (FIB-SEM) and Helium-Ion Microscopy.

For more information, please go to: www.smt.zeiss.com/nanocontest