Microscopy & Microtechniques
World’s Fastest Desktop Scanning Electron Microscope
Apr 07 2010
Phenom-World BV announced the launch of a new collection of sample holders and inserts for the Phenom™ desktop scanning electron microscope (SEM). The new holders increase the range of possible samples while maintaining the Phenom’s market-leading time to image. Quick and easy sample loading ensures faster time to data. Most industrial and research applications require imaging of non- or poorly-conducting samples. Imaging these samples with the charge reduction sample holder eliminates additional sample preparation and so reduces the critical time to data. Imaging samples such as paper, polymers, organic materials, ceramics, glass, and coatings is fast and trouble-free with this sample holder.
Imaging long, axial-shaped samples is a challenge in any SEM, but required in many industrial quality and failure applications. With the micro-tool sample holder, it is possible to make high-resolution images from samples such as drills, end-mills, routers, boring bars, engraving tools, needles, fibers, (fuel) injectors and pencils. Unique on the market, this holder enables top-down imaging of samples up to 100mm long. Samples are loaded into the holder without the need for tools or other preparation. The new micro-electronics insert enables non-destructive imaging of micro-electronics, solar cells and other wafer-based samples. The unique clamping mechanism makes glue or other adhesives obsolete, allowing the sample to be mounted quickly and then returned to the production process, or to be used in other quality and failure analysis machinery.
The X-view insert enables cross-sectional imaging of coatings, multi-layer semiconductors and fracture surfaces. Preparing the sample is fast and easy compared to costly and timeconsuming resin mounting. The X-view insert eliminates the need for screws and tools to clamp the sample. The introduction of the new holders is the second stage in series of marketfocused solutions following the successful launch of the Fibermetric™ System in 2009.
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