Launch of High Performance Atomic Force Microscope

Asylum Research announces the new MFP-3D Origin Atomic Force Microscope (AFM).  The MFP-3D Origin is at the intersection of performance and affordability in the Asylum Research MFP-3D™ AFM family. The MFP-3D Origin features the technical excellence, innovation, and world-class customer support that is the trademark of every Asylum AFM. With full upgrade potential to the MFP-3D and its complete range of accessories, the MFP-3D Origin is the best place to start with atomic force microscopy.

The MFP-3D Origin is based on the technology-leading MFP-3D AFM, known for closed-loop precision, high-resolution imaging, and low-noise force measurements. The MFP-3D Origin offers far more than just the basic scan modes. It includes many advanced modes–nanolithography, Dual AC™ Mode, and piezoresponse force microscopy. Additional advanced functionality is easy to add for optional modes such as conductive AFM, AM-FM Viscoelastic Mapping for nanomechanical analysis, scanning tunnelling microscopy (STM), and scanning thermal microscopy (SThM).

As your research grows, so can the MFP-3D Origin’s capabilities. The MFP-3D Origin can easily be upgraded to the full MFP-3D to take advantage of the numerous environmental and advanced application accessories. In addition, the MFP-3D Origin carries a full two year warranty – the best warranty in its class. It’s a smart investment in a proven AFM platform that will serve you well for years to come.