Developing a New High Definition Standard for Image Analysis

One of the biggest beneficiaries of the parallel development of high power computers and digital cameras has been particle metrology. The resultant image analysis technique is now one of the highest resolution methods available today.

With an ever-increasing range of instruments having prices from $10,000 to over $100,000, end users are seeking an independent verification that they are selecting the right instrument for their application.

For this reason, there has been a significant interest in particle size calibration standards, in particular specific standards to exploit the high-resolution power and broad dynamic range of the technique.

Although image analysis can be applied down to submicron sizes, it is in the larger size range, typically over 1mm that the method is gaining in popularity as this represents the upper limit of many other techniques.