18th Microscopy of Semi-Conducting Materials (MSM XVIII)  

St Catherine's College, University of Oxford, April 7 –April 11
Conference Co-Chairmen: John Hutchison (Oxford) and Thomas Walther (Sheffield)

Co-sponsored by EMAG, Institute of Physics and endorsed by Materials Research Society, the conference will focus on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy.

The latest developments in the use of other important microcharacterisation techniques including scanning probe microscopy and X-ray topography and diffraction will also be featured. Developments in materials science and technology covering the complete range of elemental and compound semiconductors will be described.

For full programme and details on registration contact www.rms.org