Optically Navigated Atomic Force Microscopy with Best-in-Class Atomic Resolving Power

At Analytica 2010, Bruker Nano launched the new N8 NEOS™, the first atomic force microscope (AFM) that is designed and operated like a classical optical microscope, yet with unprecedented stability and precision
that enables atomic resolution.

As today’s most advanced optically navigated AFM, the new N8 NEOS offers the familiar handling of most research optical microscopes. The sample investigation starts with optical inspection at lower and then higher
magnifications to determine the regions of interest. Finally, for highest, atomic resolution Bruker’s compact, interferometry-based AFM module NANOS™ is used.

Mounted on the objective turret just like various optical objectives, the NANOS can be positioned to the localised spot within less than 1μm simply by a turn of the turret. Due to its revolutionary new concept, the N8 NEOS
provides seamless integration of AFM into the micro- and nanoscopic inspection process.

Compared to its predecessor, fundamental parts of the new N8 NEOS AFM system have been redesigned. A rigid granite stand is incorporated for lowest thermal drift and highest stability.

The ultra-precision vertical stage is a proprietary development and enables a fast and safe auto-approach. Like all Bruker AFMs, the N8 NEOS uses fiber-optic interferometry as the basic principle for the detection of
cantilever deflection, providing superior sensitivity combined with a truly calibrated measurement of the cantilever’s deflection and amplitude, respectively.

“The N8 NEOS is the first Atomic Force Microscope that has the look and feel of a standard optical microscope. However, it expands the imaging power to the atomic level. It has been our goal to provide a nano-imaging tool without compromise in resolution or ease of use, and with the N8 NEOS we have accomplished this goal,” stated Dr Frank Saurenbach, Vice President AFM of Bruker Nano.