Jasco`s Next Generation FT-IR Microscopes

Sep 11 2008

The IRT-5000 FT-IR Microscope employs a mid-band MCT detector as standard, while up to two detectors can be installed simultaneously.
The standard "IQ Mapping" function allows multi-point, line, area and
ATR mapping experiments without moving the sample stage, in addition to single-point measurements. An optional automatic X-YZ sample stage enables auto-focus and mapping analysis of large sample areas.

Innovation in FT-IR Microscopy and Imaging Systems

Jasco`s FT-IR Imaging System

50 Years in the Analytical Instrument Marketplace

New Preparative SFE/SFC system with Chiral Detection

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