Planar Surface Preparation for SEM Cross Section Viewing

Gatan, Inc is pleased to introduce the Ilion+™, a significant advance in the preparation of large planar cross sections for microscopic imaging and microanalysis. The Ilion+ is a dedicated, ion beam based system for the
preparation of large area planar cross sections from challenging SEM samples. The Ilion+ uses a proprietary milling system that exposes significantly greater areas than traditional FIB milling while encompassing a
wider range of delicate samples not compatible with mechanical polishing and other techniques. The system is easy to install and operate allowing users to begin making samples quickly. The Ilion+ design is based on the proven Gatan PIPS™ (Precision Ion Polishing System).