Breakthrough in PMI Performance at Refineries with the World`s First Handheld XRF to Include Silicon Drift Detector (SDD)

Bruker AXS (USA) announces a technology breakthrough with the introduction of the new TracerturboSD (TM), the world`s first handheld X-ray Fluorescence (XRF) instrument that uses a Silicon Drift
Detector (SDD) for dramatically improved speed, sensitivity and
resolution. Bruker`s industry-leading proprietary XFlashâ„¢ SDD, previously available only in high-performance laboratory XRF instruments, now offers unprecedented speed and analytical specificity when integrated into the novel handheld TracerturboSD.
With this announcement, the Bruker AXS Handheld business, previously known as Keymaster Technologies Inc., builds on its long tradition of technology leadership in the handheld XRF industry that includes its introduction of the first tube-based handheld XRF in 2001, the first vacuum handheld XRF, co-invented with NASA in 2004 and this year`s launch of the first SDD-based handheld XRF.
The revolutionary TracerturboSD with integrated SDD offers unparalleled
speed, sensitivity and energy resolution, previously found only in more expensive laboratory systems. Now all handheld XRF customer segments can benefit from these compelling performance advantages in their analytical work. In PMI, the proprietary Bruker SDD technology enables TracerturboSD users to better and faster analyze sophisticated light element alloys, even without the use of a vacuum or helium attachment. In the general metals analysis markets the TracerturboSD offers higher speed, sensitivity and selectivity for many demanding handheld XRF applications.
This detector provides a major improvement in the analytical performance of handheld alloy analysers. The measurement precision is improved by a factor of two to three times, in addition to making the measurement of light elements such as Mg, Al and Si in any alloys possible when operating in air mode.
The TracerturboSD provides a new capability of measuring aluminum in titanium alloys and magnesium and silicon in aluminum alloys, with no vacuum or helium required. For additional sensitivity the well known joint Bruker-NASA vacuum technology, can be combined with the SDD to provide the best sensitivity possible in a handheld XRF instrument. In addition, the speed and resolution provided by the detector make the analysis of difficult alloys, like B-1900Hf, a routine analysis.
The TracerturboSD includes all of the standard features of the highly-regarded Bruker S1 Tracer analyser, such as Grade ID and chemistry, a unique Pass/Fail analysis capability and the largest Grade library in the industry. The capabilities of the TracerturboSD make it the ideal analyser for the measurement of all types of aerospace alloys. In addition to the new high-end TracerturboSD Bruker AXS continues to offer the standard S1 Tracerâ„¢ handheld instrument with traditional
SiPIN diode technology for routine analysis John Landefeld, Vice President of Bruker AXS Handheld, indicated:
"This breakthrough continues our tradition of technology leadership, going back to the initial introduction of tube-based XRF handhelds in 2001. Following the joint NASA-Bruker development of vacuum technology for handhelds in 2004, Bruker proves, once again, to be the technology leader in handheld XRF instrumentation. Refineries will find this to be a particularly useful instrument for positive materials identification"
"Metals industries of all types will be particularly pleased to find that high-end handheld XRF can now approach the capabilities of laboratory systems,” added John Patterson, Director of Marketing and Product Management of Bruker AXS Handheld.