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Our one-hour webinar will discuss this powerful addendum to EDS, which allows users to combine
- the light-element sensitivity of EDS with trace element analysis in the mid to heavy element range by Micro-XRF to improve the accuracy of quantification, and
- the surface sensitivity of EDS with the volume analysis capabilities of Micro-XRF.
The discussion of the analysis technique will be complemented by a number of application examples. A Q&A session will end the webinar.
Why should you attend?
- Gain information on recent developments in this analytical technique
- Learn more about how Micro-XRF can extend the analytical capabilities of your SEM
- Expand your knowledge in element analysis
- Discuss your own applications with experts
You will not be able to attend the live webcast? Register now and we will send you a copy of the slides and a link to the recording for later viewing at your convenience.
We look forward to seeing you there!
Your Bruker Nano Analytics Team
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