WDXRF Spectrometers
Wavelength dispersive X-ray fluorescence (WDXRF) is a technique that has become indispensable when fast, accurate elemental analysis is needed, as when controlling a melt in a steel works or the raw mix at a cement plant. One reason for its popularity in these applications is that its ease of use, and the ruggedness of the equipment, allows quality results to be obtained in plant conditions by operators without advanced analytical skills.
The inherent precision, speed, and sample preparation simplicity of WDXRF can often eliminate many of the problems encountered with solution-based methods like ICP and atomic absorption (AA) spectroscopy. Rigaku WDXRF technology provides freedom from interferences, high sample throughput with superior precision, and low detection limits.
Products
AZX 400
WDXRF sequential spectrometer for light-element and metal film thickness and composition measurements for up to 400 mm coupons, sputtering targets, and wafers
Learn moreWDA-3650
WDXRF simultaneous spectrometer for light-element and metal film thickness and composition measurements on wafers and media disks for up to 200 mm wafers
Learn moreWaferX 310
WDXRF simultaneous spectrometer for thickness and composition measurements for up to 300 mm wafers
Learn moreSupermini200
Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders
Learn moreZSX Primus IV𝒾
High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software
Learn moreZSX Primus IV
High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software
Learn moreZSX Primus III NEXT
Affordable, high-end, tube-above Industrial WDXRF for the analysis of solid samples
Learn moreApplication notes
Explore the example analyses to see which analytical technique is right for you.
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XRF1131 - Standardless FP Analysis of Lithium-ion Battery Cathode Material LiFePO₄ by ZSX PrimusIV
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WDXRF1126 - Accurate Quantitative Analysis of Ferrosilicon by the Fusion Method using ZSX Primus III NEXT
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WDXRF1124 - Quantitative Analysis of Blast Furnace Slag by Fusion Method on the ZSX Primus III NEXT
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WDXRF1123 - Quantitative Analysis of Stainless Steel using the ZSX Primus III NEXT
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WDXRF1122 - Silicate Rock Analysis by Fusion Bead Method on ZSX Primus III NEXT
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WDXRF1121 - Quantitative Analysis of Cast Iron using ZSX Primus III NEXT
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WDXRF1120 - Quantitative Analysis of Low Alloy Steel using the ZSX Primus III NEXT
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WDXRF1119 - Cement Raw Meal Analysis by Pressed Powder Method on the ZSX Primus III NEXT

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